Advances in X-Ray Analysis

Name: Advances in X-Ray Analysis
Brand: Springer Science+Business Media
SKU: 9780306419393
Price: 31160 HUF
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Volume 28

Szerző: Charles S. Barrett, Paul K. Predecki

Nyelv:

Kötés: Kemény kötésű

Kiadó: Springer Science+Business Media

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The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984....

Információk a könyvről

Szerző

Charles S. Barrett, Paul K. Predecki

Nyelv

Angol

Kötés

Könyv - Kemény kötésű

oldal

408

EAN

9780306419393

ISBN

0306419394

Enbook ID

01376657

Kiadó

Springer Science+Business Media

Súly

970

Teljes leírás

The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.

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Advances in X-Ray Analysis

Volume 28

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