AI, Machine Learning and Deep Learning
A Security Perspective
Szerző:
Hu, Fei (The University of Alabama, Electrical and Computer Engineering, Tuscaloosa, USA), Hei, Xiali (University of Louisiana at Lafayette, USA)
Elérhetőség:
Beszállítói készleten
Küldés 9-15 napon belül
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Today AI and Machine/Deep Learning have become the hottest areas in the information technology. This...
