Delay Fault Testing for VLSI Circuits

Name: Delay Fault Testing for VLSI Circuits
Brand: Springer-Verlag New York Inc.
SKU: 9781461375616
Price: 57138 HUF
Availability: InStock

Szerző: Angela Krstic, Kwang-Ting (Tim) Cheng

Nyelv:

Kötés: Puha kötésű

Kiadó: Springer-Verlag New York Inc.

Elérhetőség: Beszállítói készleten

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In the early days of digital design, we were concerned with the logical correctness of circuits. We...

Információk a könyvről

Szerző

Angela Krstic, Kwang-Ting (Tim) Cheng

Nyelv

Angol

Kötés

Könyv - Puha kötésű

Kiadva

1998

oldal

191

EAN

9781461375616

ISBN

1461375614

Enbook ID

06796977

Kiadó

Springer-Verlag New York Inc.

Súly

326

Méretek

155 x 235 x 12

Teljes leírás

In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.

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Delay Fault Testing for VLSI Circuits

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