Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Name: Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Brand: Springer
SKU: 9780792393061
Price: 40448 HUF
Availability: InStock

Theory and Computational Models

Szerző: José Pineda de Gyvez

Nyelv:

Kötés: Kemény kötésű

Kiadó: Springer

Elérhetőség: Beszállítói készleten alacsony példányszámban

Küldés 13-18 napon belül

40 448 Ft

The history of this book begins way back in 1982. At that time a research proposal was filed with th...

Információk a könyvről

Szerző

José Pineda de Gyvez

Nyelv

Angol

Kötés

Könyv - Kemény kötésű

Kiadva

1992

oldal

167

EAN

9780792393061

ISBN

0792393066

Enbook ID

05251297

Kiadó

Springer

Súly

1000

Méretek

155 x 235 x 13

Teljes leírás

The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the "silicon foundry" concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's). Those fabrication plants would be concentrated with only a few market leaders.

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Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Theory and Computational Models

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