Könyv Kelvin Probe Force Microscopy Sascha Sadewasser

Kelvin Probe Force Microscopy

Measuring and Compensating Electrostatic Forces

Nyelv: Angol
Kötés: Kemény kötésű
Elérhetőség: Beszállítói készleten alacsony példányszámban
Küldés 13-18 napon belül
40 300 Ft
Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique a...

Információk a könyvről

Nyelv
Angol
Kötés
Könyv - Kemény kötésű
Kiadva
2011
oldal
334
EAN
9783642225659
ISBN
3642225659
Enbook ID
01658439
Súly
656
Méretek
162 x 242 x 25

Teljes leírás

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

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