Könyv Kelvin Probe Force Microscopy Sascha Sadewasser

Kelvin Probe Force Microscopy

Nyelv: Angol
Kötés: Kemény kötésű
Elérhetőség: Beszállítói készleten
Küldés 10-18 napon belül
76 066 Ft
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force mic...

Információk a könyvről

Nyelv
Angol
Kötés
Könyv - Kemény kötésű
Kiadva
2018
oldal
521
EAN
9783319756868
ISBN
3319756869
Enbook ID
18836065
Súly
986
Méretek
242 x 167 x 38

Teljes leírás

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

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