Angol
Microscopic X-ray Fluorescence Analysis Edited by Koen H. A. Janssens, Freddy C. V. Adams Department of Chemistry, University of Antwerp, Belgium and Anders Rindby Department of Physics, Chalmers University of Technology, G?teborg, Sweden In the last 10-15 years many analytical advances in X-ray fluorescence analysis (XRF) have taken place, giving rise to non-destructive ultrasensitive surface analyses of materials. One of the variants of XRF developed is micro-XRF (?-XRF), which is able to analyse the distribution of major, minor and trace elements in microscopic sample surface areas. Due to the availability of commercial instrumentation and the development of simple devices for focusing X-rays, ?-XRF has increased in popularity and is able to fill the gap between bulk X-ray fluorescence and electron probe X-ray microanalysis (EPXMA). Microscopic X-ray Fluorescence Analysis is the first single volume to bring together introductory and advanced information on the essential aspects of the technique, thereby providing an excellent overview of the developments and applications of ?-XRF. Topics discussed in the book include: Interaction of X-rays with matter Micro-focusing X-ray optics Instrumentation for ?-XRF with laboratory and synchrotron sources Evaluation and calibration of ?-XRF data Comparison of ?-XRF to other microanalytical techniques. In addition, the final chapters of the book describe applications of ?-XRF in the geosciences, in art and archaeology, environmental and biological applications, and the use of ?-XRF for industrial purposes. Finally an overview is presented of some of the new directions both laboratory and synchrotron ?-XRF are likely to take in the 21st Century.
