Power Devices Electrothermal Characterisation by Optical Techniques - An Experimental Approach to Analyse Internal Electrothermal Phenomena at Device

Name: Power Devices Electrothermal Characterisation by Optical Techniques - An Experimental Approach to Analyse Internal Electrothermal Phenomena at Device
Brand: VDM Verlag Dr. Mueller E.K.
SKU: 9783836474801
Price: 23672 HUF
Availability: InStock

Szerző: Perpina Xavier

Nyelv:

Kötés: Puha kötésű

Kiadó: VDM Verlag Dr. Mueller E.K.

Elérhetőség: Beszállítói készleten

Küldés 14-21 napon belül

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The characterisation of semiconductor devices has an important role in Microelectronics, especially...

Információk a könyvről

Szerző

Perpina Xavier

Nyelv

Angol

Kötés

Könyv - Puha kötésű

Kiadva

2008

oldal

152

EAN

9783836474801

ISBN

3836474808

Enbook ID

07158708

Kiadó

VDM Verlag Dr. Mueller E.K.

Súly

213

Méretek

152 x 229 x 8

Teljes leírás

The characterisation of semiconductor devices has an important role in Microelectronics, especially in the case of power semiconductor devices, in which the electrothermal characterisation is an essential aspect to study their behaviour. In several Power Electronics applications, non-controlled electrothermal phenomena are the responsible for the device destruction. The internal self-heating experienced by Power Devices generates an internal temperature rise, which may negatively affect their internal physical behaviour. §In this framework, this book covers the development of an experimental rig for temperature and free-carrier concentration measurement in power devices, based on the internal IR-laser deflection (IIR-LD) and free-carrier absorption (FCA) techniques. IIR-LD allows a complete characterisation of power devices, extracting its temperature and free-carrier concentration gradients. By contrast, FCA provides the carrier concentration at the drift region of bipolar power devices. With both techniques, paramount information related to power devices physical behaviour are derived.

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Power Devices Electrothermal Characterisation by Optical Techniques - An Experimental Approach to Analyse Internal Electrothermal Phenomena at Device

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