Reliability, Yield, and Stress Burn-In

Name: Reliability, Yield, and Stress Burn-In
Brand: Springer, Berlin
SKU: 9781461375968
Price: 63719 HUF
Availability: InStock

A Unified Approach for Microelectronics Systems Manufacturing & Software Development

Szerző: ay Kuo, ei-Ting Kary Chien, aeho Kim

Nyelv:

Kötés: Puha kötésű

Kiadó: Springer, Berlin

Elérhetőség: Beszállítói készleten alacsony példányszámban

Küldés 13-18 napon belül

63 719 Ft

The international market is very competitive for high-tech manufacturers to day. Achieving competiti...

Információk a könyvről

Szerző

ay Kuo, ei-Ting Kary Chien, aeho Kim

Nyelv

Angol

Kötés

Könyv - Puha kötésű

Kiadva

2014

oldal

394

EAN

9781461375968

ISBN

1461375967

Enbook ID

05257850

Kiadó

Springer, Berlin

Súly

646

Méretek

155 x 235 x 22

Teljes leírás

The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: the economic impact of employing the microelectronics fabricated by in dustry, a study of the relationship between reliability and yield, the progression toward miniaturization and higher reliability, and the correctness and complexity of new system designs, which include a very significant portion of software.

Érdekelheti

Azok a vásárlók, akik ezt a könyvet megvásárolták, a következőket is megvásárolták

Leggyakrabban keresett

Categories

Authors

Publishers

Termékek

Termékek

Leggyakrabban keresett

Categories

Authors

Publishers

Termékek

Termékek

Reliability, Yield, and Stress Burn-In

A Unified Approach for Microelectronics Systems Manufacturing & Software Development

Információk a könyvről

Teljes leírás

Érdekelheti

Azok a vásárlók, akik ezt a könyvet megvásárolták, a következőket is megvásárolták