Könyv Stress-Induced Phenomena in Metallization Shinichi Ogawa

Stress-Induced Phenomena in Metallization

Ninth International Workshop on Stress-Induced Phenomena in Metallization

Nyelv: Angol
Kötés: Kemény kötésű
Elérhetőség: 50 % esély
Keressük az egész világon
65 178 Ft
The conference was on reliability related science in ULSI interconnect. Its main purpose was to disc...

Információk a könyvről

Nyelv
Angol
Kötés
Könyv - Kemény kötésű
Kiadva
2007
oldal
204
EAN
9780735404595
ISBN
0735404593
Enbook ID
01391065
Méretek
162 x 234

Teljes leírás

The conference was on reliability related science in ULSI interconnect. Its main purpose was to discuss the stress induced phenomena in the LSI interconnect among academic researchers and industry engineers to establish academic science and to improve the reliability of ULSI chips. All papers were peer reviewed.

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