Transmission Electron Microscopy

Name: Transmission Electron Microscopy
Brand: Springer International Publishing AG
SKU: 9783319266497
Price: 47054 HUF
Availability: InStock

Diffraction, Imaging, and Spectrometry

Szerző: C. Barry Carter, David B. Williams

Nyelv:

Kötés: Kemény kötésű

Kiadó: Springer International Publishing AG

Elérhetőség: Kiadói készleten rendelésre

Küldés 17-27 napon belül

47 054 Ft

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Scienc...

Információk a könyvről

Szerző

C. Barry Carter, David B. Williams

Nyelv

Angol

Kötés

Könyv - Kemény kötésű

Kiadva

2016

oldal

518

EAN

9783319266497

ISBN

3319266497

Enbook ID

09931565

Kiadó

Springer International Publishing AG

Súly

1466

Méretek

217 x 288 x 27

Teljes leírás

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today's instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging-the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science.§§Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.§§

Érdekelheti

Azok a vásárlók, akik ezt a könyvet megvásárolták, a következőket is megvásárolták

Leggyakrabban keresett

Categories

Authors

Publishers

Termékek

Termékek

Leggyakrabban keresett

Categories

Authors

Publishers

Termékek

Termékek

Transmission Electron Microscopy

Diffraction, Imaging, and Spectrometry

Információk a könyvről

Teljes leírás

Érdekelheti

Azok a vásárlók, akik ezt a könyvet megvásárolták, a következőket is megvásárolták