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Könyv Scanning Microscopy for Nanotechnology Weilie Zhou

Scanning Microscopy for Nanotechnology

Techniques and Applications

Szerző: Weilie Zhou, Zhong-lin Wang
Nyelv: Angol
Kötés: Kemény kötésű
Kiadó: Springer-Verlag New York Inc.
Elérhetőség: Beszállítói készleten
Küldés 10-13 napon belül
88 413 Ft
With the rapid development of nanotechnology, scanning electron microscopy (SEM) can be exploited no...

Információk a könyvről

Szerző
Weilie Zhou, Zhong-lin Wang
Nyelv
Angol
Kötés
Könyv - Kemény kötésű
Kiadva
2006
oldal
522
EAN
9780387333250
ISBN
0387333258
Enbook ID
01381837
Kiadó
Springer-Verlag New York Inc.
Súly
1087
Méretek
155 x 235 x 38

Teljes leírás

With the rapid development of nanotechnology, scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization, but also integrated with new technology for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology is comprised of both techniques and application chapters, and covers topics including nanomaterials imaging, X-ray microanalysis, high resolution SEM, low kV SEM, cryo-SEM, as well as new techniques including electron back scatter diffracation (EBSD) and scanning transmission electron microscopy (STEM). The fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Applications include the study of nanoparticles, nanowires and nanotubes, three dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. The book will appeal not only to a broad range of nanomaterials researchers, but to SEM development specialists as well.

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